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X-ray Absorption Spectroscopy and X-ray Diffraction of Co/SiO2

Eteläniemi, V.; Backman, L.B.; Rautiainen, Aimo; Krause, A.O.I.; Paakkari, T.
-1998Publicationer information ikon

X-ray examination and weldstrength factor

Eiro, Olavi
Valtion teknillinen tutkimuslaitos. Tiedotus: Sarja II. Metalli1960Publicationer information ikon

Characterization of TlBr for X-ray and γ-ray detector applications

Referentgranskad
DOI
10.1016/j.nima.2009.03.125
Kostamo, P.; Shorohov, M.; Gostilo, V.; Sipilä, H.; Kozlov, V.; Lisitsky, I.; Kuznetsov, M.; Lankine...
Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detecto...2009Publicationer information ikon

The Athena X-ray Integral Field Unit (X-IFU)

Referentgranskad
Öppen tillgång
DOI
10.1117/12.2312409
Barret, Didier; Thien Lam Trong, ; den Herder, Jan-Willem; Piro, Luigi; Cappi, Massimo; Huovelin, Ju...
Proceedings of SPIE2018Publicationer information ikon

Laser-Induced X-Ray Transmutation of Nuclides

Aarnio, P.; Andreev, A.A.; Salomaa, R.
-2011Publicationer information ikon

Polarization of nonresonant inelastic X-ray scattering

Referentgranskad
Åberg, Teijo; Heinäsmäki, S.
Journal of Physics B: Atomic Molecular and Optical Physics1997Publicationer information ikon

The Athena X-ray Integral Field Unit (X-IFU)

Referentgranskad
Öppen tillgång
DOI
10.1007/s10909-018-1904-5
Pajot, F.; Barret, D.; Lam-Trong, T.; den Herder, J. -W.; Piro, L.; Cappi, M.; Huovelin, J.; Kelley,...
Journal of Low Temperature Physics2018Publicationer information ikon

XIPE The X-ray imaging polarimetry explorer

Referentgranskad
Öppen tillgång
DOI
10.1117/12.2233046
Soffitta, P.; Bellazzini, R.; Bozzo, E.; Burwitz, V.; Castro-Tirado, A. J.; Costa, E.; Courvoisier, ...
Proceedings of SPIE : the International Society for Optical Engineering2016Publicationer information ikon

Characterization of InGaN/GaN and AlGaN/GaN superlattices by X-ray diffraction and X-ray reflectivity measurements

Referentgranskad
DOI
10.1002/pssc.200983630
Sintonen, Sakari; Suihkonen, Sami; Svensk, Olli; Törmä, Pekka Tuomas; Ali, Muhammad; Sopanen, Markku...
PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS2010Publicationer information ikon

Semiquantitative analysis of paint pigments by X-ray fluorescence

Heinonen, Kalervo; Visapää, Asko
Valtion teknillinen tutkimuslaitos. Tiedotus: Sarja IV. Kemia1966

X-ray Absorption Spectroscopy and X-ray Diffraction of Co/SiO2

1998

X-ray examination and weldstrength factor

1960

Characterization of TlBr for X-ray and γ-ray detector applications

Referentgranskad
DOI
10.1016/j.nima.2009.03.125
2009

The Athena X-ray Integral Field Unit (X-IFU)

Referentgranskad
Öppen tillgång
DOI
10.1117/12.2312409
2018

Laser-Induced X-Ray Transmutation of Nuclides

2011

Polarization of nonresonant inelastic X-ray scattering

Referentgranskad
1997

The Athena X-ray Integral Field Unit (X-IFU)

Referentgranskad
Öppen tillgång
DOI
10.1007/s10909-018-1904-5
2018

XIPE The X-ray imaging polarimetry explorer

Referentgranskad
Öppen tillgång
DOI
10.1117/12.2233046
2016

Characterization of InGaN/GaN and AlGaN/GaN superlattices by X-ray diffraction and X-ray reflectivity measurements

Referentgranskad
DOI
10.1002/pssc.200983630
2010

Semiquantitative analysis of paint pigments by X-ray fluorescence

1966